锐峰先科技术有限公司
BE FIRST TECHNOLOGY CO., LTD
TESCAN Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)
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Tescan FIB-SEM systems combine fast, precise milling with high - resolution imaging and advanced automation. Choose from Ga+ or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
Tescan FIB-SEM systems give you precise control for cutting, shaping, and analyzing structures at the nanoscale. You can choose between focused Ga⁺ beams for fine detail or Xe plasma beams for fast volume processing, supported by high-resolution SEM imaging and flexible analytical workflows.
Use modular platforms, intuitive software, and expert guidance to move confidently from question to insight.
Main models (click on the model link to view detailed introduction):
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